Strain-engineered MOSFETs /

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Bibliographic Details
Main Authors:	Maiti, C. K. (Author), Maiti, T. K. (Author)
Format:	Electronic eBook
Language:	English
Published:	Boca Raton : CRC Press, Taylor & Francis, [2013]
Subjects:	Integrated circuits > Fault tolerance. Metal oxide semiconductor field-effect transistors > Reliability. Strains and stresses. Electronic books.
Online Access:	Click to View
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Strain-engineered MOSFETs / by Maiti, C. K., Maiti, T. K.

Published [2013]

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Electronic eBook