Electromigration in ULSI interconnections

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Bibliographic Details
Main Author: Tan, Cher Ming, 1959-
Corporate Author: ebrary, Inc
Format: Electronic eBook
Language:English
Published: Hackensack, N.J. : World Scientific, c2010.
Series:International series on advances in solid state electronics and technology.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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