Electromigration in ULSI interconnections
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| Main Author: | |
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| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hackensack, N.J. :
World Scientific,
c2010.
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| Series: | International series on advances in solid state electronics and technology.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| Physical Description: | xix, 291 p. : ill. (some col.), col. port. |
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| Bibliography: | Includes bibliographical references and index. |