Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma Chicago
Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma MLA
Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
Successfully copied to clipboard
Copying to clipboard failed
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.