Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
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Chicago Style (17th ed.) Citation
Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
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ציטוט MLA
Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
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אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.