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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

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Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formato: Electrónico Conference Proceeding eBook
Idioma:inglés
Publicado: Materials Park, OH : ASM International, c2005.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Acceso en liña:An electronic book accessible through the World Wide Web; click to view
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Descrición Física:xviii, 524 p. : ill.
Bibliografía:Includes bibliographical references and index.

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