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ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c1999.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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