ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

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Bibliografski detalji
Autori kompanije: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Elektronički Izvještaj sastanka e-knjiga
Jezik:engleski
Izdano: Materials Park, OH : ASM International, c1999.
Teme:
Online pristup:An electronic book accessible through the World Wide Web; click to view
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Opis
Opis predmeta:Sponsored by EDFAS, ISTFA.
Opis fizičkog objekta:xvii, 486 p. : ill.
Bibliografija:Includes bibliographical references and index.