Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
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Dyfyniad Arddull Chicago
Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
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Dyfyniad MLA
Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
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Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.