APA (7e ed.) Bronvermelding
Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
Chicago (17e ed.) Bronvermelding
Gray, Kirk, en John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
MLA (9e ed.) Bronvermelding
Gray, Kirk, en John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
Let op: Deze citaties zijn niet altijd 100% accuraat.