Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
芝加哥风格引文Gray, Kirk, 与 John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
MLA引文Gray, Kirk, 与 John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
警告：这些引文格式不一定是100％准确.