Next generation HALT and HASS : robust design of electronics and systems /

Furkejuvvon:
Bibliográfalaš dieđut
Váldodahkkit: Gray, Kirk (Dahkki), Paschkewitz, John James (Dahkki)
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Ráidu:Wiley series in quality and reliability engineering.
Fáttát:
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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