Next generation HALT and HASS : robust design of electronics and systems /

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Bibliografiske detaljer
Main Authors: Gray, Kirk (Author), Paschkewitz, John James (Author)
Format: Electronisk eBog
Sprog:engelsk
Udgivet: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Serier:Wiley series in quality and reliability engineering.
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Online adgang:An electronic book accessible through the World Wide Web; click to view
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