Next generation HALT and HASS : robust design of electronics and systems /
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| Hlavní autoři: | , |
|---|---|
| Médium: | Elektronický zdroj E-kniha |
| Jazyk: | angličtina |
| Vydáno: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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| Edice: | Wiley series in quality and reliability engineering.
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| Témata: | |
| On-line přístup: | An electronic book accessible through the World Wide Web; click to view |
| Tagy: |
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MARC
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| 005 | 20171002070507.0 | ||
| 006 | m o d | | ||
| 007 | cr cn||||||||| | ||
| 008 | 151207s2016 enkad ob 001 0 eng|d | ||
| 020 | |z 9781118700235 (cloth) | ||
| 020 | |z 9781118700228 | ||
| 020 | |a 9781118700204 (e-book) | ||
| 035 | |a (MiAaPQ)ebr11172310 | ||
| 040 | |a MiAaPQ |b eng |e rda |e pn |c MiAaPQ |d MiAaPQ | ||
| 050 | 4 | |a TA169.3 |b .G73 2016eb | |
| 082 | 0 | 4 | |a 621.381028/7 |2 23 |
| 100 | 1 | |a Gray, Kirk, |e author. | |
| 245 | 1 | 0 | |a Next generation HALT and HASS : |b robust design of electronics and systems / |c Kirk Gray, John James Paschkewitz. |
| 264 | 1 | |a Chichester, West Sussex, United Kingdom ; |a Hoboken, NJ : |b Wiley, |c 2016. | |
| 300 | |a 1 online resource (299 pages) : |b illustrations (some color) | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 490 | 1 | |a Wiley series in quality and reliability engineering | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods. | |
| 588 | |a Description based on print version record. | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Accelerated life testing. | |
| 650 | 0 | |a Electronic systems |x Design and construction. | |
| 650 | 0 | |a Electronic systems |x Testing. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Paschkewitz, John James, |e author. | |
| 776 | 0 | 8 | |i Print version: |a Gray, Kirk. |t Next generation HALT and HASS : robust design of electronics and systems. |d Chichester, West Sussex, United Kingdom : Wiley, 2016 |k Wiley series in quality and reliability engineering |z 9781118700228 |
| 797 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Wiley series in quality and reliability engineering. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=11172310 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 186965 |d 186965 | ||