Next generation HALT and HASS : robust design of electronics and systems /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi matua: Gray, Kirk (Author), Paschkewitz, John James (Author)
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Rangatū:Wiley series in quality and reliability engineering.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
Ngā Tūtohu: Tāpirihia he Tūtohu
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
Whakaahuatanga
Whakaahuatanga ōkiko:1 online resource (299 pages) : illustrations (some color)
Rārangi puna kōrero:Includes bibliographical references and index.
ISBN:9781118700204 (e-book)