APA引文

Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.

Chicago Style (17th ed.) Citation

Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.

MLA引文

Gray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.