Gray, K., & Paschkewitz, J. J. (2016). Next generation HALT and HASS: Robust design of electronics and systems. Wiley.
Chicago Style (17th ed.) CitationGray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Chichester, West Sussex, United Kingdom ; Hoboken, NJ: Wiley, 2016.
MLA (9th ed.) CitationGray, Kirk, and John James Paschkewitz. Next Generation HALT and HASS: Robust Design of Electronics and Systems. Wiley, 2016.
Warning: These citations may not always be 100% accurate.