Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /
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| Corporate Author: | |
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| Other Authors: | , |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Durnten-Zurich, Switzerland ; Enfield, NH, USA :
TTP,
[2012]
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| Series: | Diffusion and defect data. Solid state phenomena ;
volumes 186. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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