Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /
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Corporate Author: | |
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Other Authors: | , |
Format: | Electronic Conference Proceeding eBook |
Language: | English |
Published: |
Durnten-Zurich, Switzerland ; Enfield, NH, USA :
TTP,
[2012]
|
Series: | Diffusion and defect data. Solid state phenomena ;
volumes 186. |
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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020 | |z 9783037853818 (hardback) | ||
020 | |a 9783038136996 (e-book) | ||
035 | |a (CaPaEBR)ebr10828215 | ||
035 | |a (OCoLC)872671166 | ||
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050 | 1 | 4 | |a QH212.E4 |b I57 2011eb |
082 | 0 | 4 | |a 502.825 |2 23 |
111 | 2 | |a International Conference on Electron Microscopy |n (14th : |d 2011 : |c Wisła, Poland), |j issuing body. | |
245 | 1 | 0 | |a Electron microscopy XIV : |b selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / |c edited by Danuta Stróż and Krystian Prusik. |
246 | 3 | 0 | |a Electron microscopy 14 |
264 | 1 | |a Durnten-Zurich, Switzerland ; |a Enfield, NH, USA : |b TTP, |c [2012] | |
264 | 4 | |c ©2012 | |
300 | |a 1 online resource (352 pages) : |b illustrations (some color). | ||
336 | |a text |2 rdacontent | ||
337 | |a computer |2 rdamedia | ||
338 | |a online resource |2 rdacarrier | ||
490 | 1 | |a Solid state phenomena, |x 1012-0394 ; |v volumes 186 | |
504 | |a Includes bibliographical references and indexes. | ||
588 | |a Description based on print version record. | ||
590 | |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
650 | 0 | |a Electron microscopy |v Congresses. | |
655 | 0 | |a Electronic books. | |
700 | 1 | |a Stróż, Danuta. | |
700 | 1 | |a Prusik, Krystian. | |
776 | 0 | 8 | |i Print version: |a International Conference on Electron Microscopy. |t Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland. |d Durnten-Zurich, Switzerland : TTP, [2012] |h xiii, 341 pages ; 25 cm. |k Solid state phenomena ; volumes 186 |x 1012-0394 ; |z 9783037853818 |w (OCoLC)ocn801662615 |w (DLC) 2012538041 |
797 | 2 | |a ebrary. | |
830 | 0 | |a Diffusion and defect data. |n Pt. B, |p Solid state phenomena ; |v volumes 186. | |
856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10828215 |z An electronic book accessible through the World Wide Web; click to view |
908 | |a 170314 | ||
942 | 0 | 0 | |c EB |
999 | |c 168614 |d 168614 |