Electromigration in ULSI interconnections

Gorde:

Xehetasun bibliografikoak
Egile nagusia:	Tan, Cher Ming, 1959-
Erakunde egilea:	ebrary, Inc
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Hackensack, N.J. : World Scientific, c2010.
Saila:	International series on advances in solid state electronics and technology.
Gaiak:	Integrated circuits > Ultra large scale integration. Electrodiffusion. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

MARC


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007	cr cn\|\|\|\|\|\|\|\|\|
008	110308s2010 njuac sb 001 0 eng d
010			\|z 2011280775
020			\|z 9814273325
020			\|z 9789814273329
020			\|z 9789814273336 (e-book)
035			\|a (CaPaEBR)ebr10480052
035			\|a (OCoLC)714877548
040			\|a CaPaEBR \|c CaPaEBR
050	1	4	\|a TK7874.76 \|b .T36 2010eb
100	1		\|a Tan, Cher Ming, \|d 1959-
245	1	0	\|a Electromigration in ULSI interconnections \|h [electronic resource] / \|c Cher Ming Tan.
260			\|a Hackensack, N.J. : \|b World Scientific, \|c c2010.
300			\|a xix, 291 p. : \|b ill. (some col.), col. port.
490	1		\|a International series on advances in solid state electronics and technology (ASSET)
504			\|a Includes bibliographical references and index.
533			\|a Electronic reproduction. \|b Palo Alto, Calif. : \|c ebrary, \|d 2013. \|n Available via World Wide Web. \|n Access may be limited to ebrary affiliated libraries.
650		0	\|a Integrated circuits \|x Ultra large scale integration.
650		0	\|a Electrodiffusion.
655		7	\|a Electronic books. \|2 local
710	2		\|a ebrary, Inc.
830		0	\|a International series on advances in solid state electronics and technology.
856	4	0	\|u http://site.ebrary.com/lib/daystar/Doc?id=10480052 \|z An electronic book accessible through the World Wide Web; click to view
908			\|a 170314
942	0	0	\|c EB
999			\|c 125313 \|d 125313