Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
Chicago Style (17th ed.) ZitazioaTan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
MLA (9th ed.) ZitazioaTan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
Kontuz: berrikusi erreferentzia hauek erabili aurretik.