APA-viite (7. p.)

Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.

Chicago-viite (17. p.)

Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.

MLA-viite (9. p.)

Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.