Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
Chicagoスタイル(17版)引用形式Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
MLA(9版)引用形式Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
警告: この引用は必ずしも正確ではありません.