Cita APA (7th ed.)
Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
Cita Chicago (17th ed.)
Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
Cita MLA (9th ed.)
Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
Atenció: Aquestes cites poden no estar 100% correctes.