APA (7th ed.) Citation

Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.

Chicago Style (17th ed.) Citation

Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.

MLA (9th ed.) Citation

Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.

Warning: These citations may not always be 100% accurate.