Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.
芝加哥风格引文Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.
MLA引文Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.
警告：这些引文格式不一定是100％准确.