APA引文

Tan, C. M. (2010). Electromigration in ULSI interconnections. World Scientific.

Chicago Style (17th ed.) Citation

Tan, Cher Ming. Electromigration in ULSI Interconnections. Hackensack, N.J.: World Scientific, 2010.

MLA引文

Tan, Cher Ming. Electromigration in ULSI Interconnections. World Scientific, 2010.

警告：這些引文格式不一定是100％准確.