ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Saved in:
| Corporate Authors: | , , , |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, OH :
ASM International,
c1999.
|
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000nam a2200000Ia 4500 | ||
|---|---|---|---|
| 001 | 0000112472 | ||
| 005 | 20171002055926.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 000406s1999 ohua sb 101 0 eng d | ||
| 020 | |z 0871706466 | ||
| 035 | |a (CaPaEBR)ebr10323467 | ||
| 035 | |a (OCoLC)646817788 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871.85 |b .I48 1999eb |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (25th : |d 1999 : |c Santa Clara, Calif.) | |
| 245 | 1 | 0 | |a ISTFA '99 |h [electronic resource] : |b proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. |
| 246 | 3 | 0 | |a Proceedings of the 25th International Symposium or Testing and Failure Analysis |
| 246 | 3 | 0 | |a Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis |
| 260 | |a Materials Park, OH : |b ASM International, |c c1999. | ||
| 300 | |a xvii, 486 p. : |b ill. | ||
| 500 | |a Sponsored by EDFAS, ISTFA. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10323467 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101622 |d 101622 | ||