High performance memory testing design principles, fault modeling, and self-test /
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| Glavni autor: | |
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| Autor kompanije: | |
| Format: | Elektronički e-knjiga |
| Jezik: | engleski |
| Izdano: |
Boston :
Kluwer Academic,
c2003.
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| Serija: | Frontiers in electronic testing.
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| Teme: | |
| Online pristup: | An electronic book accessible through the World Wide Web; click to view |
| Oznake: |
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Slični predmeti: High performance memory testing
- Non-volatile memories /
- Vertical 3D memory technologies /
- System-on-chip test architectures nanometer design for testability /
- High density data storage principle, technology, and materials /
- Terrestrial neutron-induced soft errors in advanced memory devices
- Data Storage faster access to smaller bits.