High performance memory testing design principles, fault modeling, and self-test /
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| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston :
Kluwer Academic,
c2003.
|
| Series: | Frontiers in electronic testing.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 082 | 0 | 4 | |a 621.39/732 |2 21 |
| 100 | 1 | |a Adams, R. Dean. | |
| 245 | 1 | 0 | |a High performance memory testing |h [electronic resource] : |b design principles, fault modeling, and self-test / |c R. Dean Adams. |
| 260 | |a Boston : |b Kluwer Academic, |c c2003. | ||
| 300 | |a xiii, 246 p. : |b ill. | ||
| 490 | 1 | |a Frontiers in electronic testing | |
| 504 | |a Includes bibliographical references (p. [229]-239) and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Semiconductor storage devices |x Testing. | |
| 650 | 0 | |a Computer storage devices |x Testing. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ebrary, Inc. | |
| 830 | 0 | |a Frontiers in electronic testing. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10067254 |z An electronic book accessible through the World Wide Web; click to view |
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