Terrestrial neutron-induced soft errors in advanced memory devices
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hackensack, NJ :
World Scientific,
c2008.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| Physical Description: | xxii, 343 p. : ill. (some col.) |
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| Bibliography: | Includes bibliographical references (p. 291-315) and index. |