Terrestrial neutron-induced soft errors in advanced memory devices
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| フォーマット: | 電子媒体 eBook |
| 言語: | 英語 |
| 出版事項: |
Hackensack, NJ :
World Scientific,
c2008.
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| オンライン･アクセス: | An electronic book accessible through the World Wide Web; click to view |
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