Cita APA (7a ed.)
ebrary, Inc, & Nakamura, T. (2008). Terrestrial neutron-induced soft errors in advanced memory devices. World Scientific.
Cita Chicago Style (17a ed.)
ebrary, Inc, y Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. Hackensack, NJ: World Scientific, 2008.
Cita MLA (9a ed.)
ebrary, Inc, y Takashi Nakamura. Terrestrial Neutron-induced Soft Errors in Advanced Memory Devices. World Scientific, 2008.
Precaución: Estas citas no son 100% exactas.