System-on-chip test architectures nanometer design for testability /

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: Electronic eBook
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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010 |z  2007023373 
020 |z 9780123739735 (hardcover : alk. paper) 
020 |z 012373973X (hardcover : alk. paper) 
035 |a (CaPaEBR)ebr10203465 
035 |a (OCoLC)228148482 
040 |a CaPaEBR  |c CaPaEBR 
050 1 4 |a TK7895.E42  |b S978 2008eb 
082 0 4 |a 621.39/5  |2 22 
245 0 0 |a System-on-chip test architectures  |h [electronic resource] :  |b nanometer design for testability /  |c edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. 
260 |a Amsterdam ;  |a Boston :  |b Morgan Kaufmann Publishers,  |c c2008. 
300 |a xxxvi, 856 p. :  |b ill. 
490 1 |a The Morgan Kaufmann series in systems on silicon 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Systems on a chip  |x Testing. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design. 
655 7 |a Electronic books.  |2 local 
700 1 |a Wang, Laung-Terng. 
700 1 |a Stroud, Charles E. 
700 1 |a Touba, Nur A. 
710 2 |a ebrary, Inc. 
830 0 |a Morgan Kaufmann series in systems on silicon. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10203465  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 85792  |d 85792