System-on-chip test architectures nanometer design for testability /
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| Autor Corporativo: | |
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| Outros autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | inglés |
| Publicado: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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| Series: | Morgan Kaufmann series in systems on silicon.
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| Subjects: | |
| Acceso en liña: | An electronic book accessible through the World Wide Web; click to view |
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