System-on-chip test architectures nanometer design for testability /
Guardat en:
| Autor corporatiu: | |
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| Altres autors: | , , |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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| Col·lecció: | Morgan Kaufmann series in systems on silicon.
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| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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- System-on-chip test architectures nanometer design for testability /
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