Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Saved in:
| Hovedforfatter: | |
|---|---|
| Institution som forfatter: | |
| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
New York :
Oxford University Press,
1994.
|
| Udgivelse: | Rev. ed. |
| Serier: | Oxford series in optical and imaging sciences ;
5. |
| Fag: | |
| Online adgang: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
Ingen Tags, Vær først til at tagge denne postø!
|
Lignende værker: Scanning force microscopy
- Scanning force microscopy with applications to electric, magnetic, and atomic forces /
- Atomic force microscopy exploring basic modes and advanced applications /
- Atomic force microscopy exploring basic modes and advanced applications /
- Introduction to scanning tunneling microscopy
- Introduction to scanning tunneling microscopy
- Scanning probe microscopy