Scanning force microscopy with applications to electric, magnetic, and atomic forces /
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| Autor principal: | |
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| Autor corporatiu: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
New York :
Oxford University Press,
1994.
|
| Edició: | Rev. ed. |
| Col·lecció: | Oxford series in optical and imaging sciences ;
5. |
| Matèries: | |
| Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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