Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Shranjeno v:
| Glavni avtor: | |
|---|---|
| Korporativna značnica: | |
| Format: | Elektronski eKnjiga |
| Jezik: | angleščina |
| Izdano: |
New York :
Oxford University Press,
1994.
|
| Izdaja: | Rev. ed. |
| Serija: | Oxford series in optical and imaging sciences ;
5. |
| Teme: | |
| Online dostop: | An electronic book accessible through the World Wide Web; click to view |
| Oznake: |
Brez oznak, prvi označite!
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