Scanning force microscopy with applications to electric, magnetic, and atomic forces /
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| Auteur principal: | |
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| Collectivité auteur: | |
| Format: | Électronique eBook |
| Langue: | anglais |
| Publié: |
New York :
Oxford University Press,
1994.
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| Édition: | Rev. ed. |
| Collection: | Oxford series in optical and imaging sciences ;
5. |
| Sujets: | |
| Accès en ligne: | An electronic book accessible through the World Wide Web; click to view |
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