Scanning force microscopy with applications to electric, magnetic, and atomic forces /

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Bibliographic Details
Main Author: Sarid, Dror
Corporate Author: ebrary, Inc
Format: Electronic eBook
Language:English
Published: New York : Oxford University Press, 1994.
Edition:Rev. ed.
Series:Oxford series in optical and imaging sciences ; 5.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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Description
Physical Description:xiii, 263 p. : ill.
Bibliography:Includes bibliographical references (p. 233-259) and index.