ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
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| Corporate Author: | |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
2013.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| LEADER | 00000nam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | 0000186694 | ||
| 005 | 20171002065203.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 140830t20132013ohuado ob 001 0 eng d | ||
| 020 | |z 9781627080224 | ||
| 020 | |a 9781627080231 (e-book) | ||
| 035 | |a (CaPaEBR)ebr10909850 | ||
| 035 | |a (OCoLC)891400347 | ||
| 040 | |a CaPaEBR |b eng |e rda |e pn |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .I584 2013eb |
| 082 | 0 | 4 | |a 621.381 |2 23 |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (39th : |d 2013 : |c San Jose, California) | |
| 245 | 1 | 0 | |a ISTFA 2013 : |b conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / |c sponsored by Electronic Device Failure Analysis Society. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c 2013. | |
| 264 | 4 | |c ©2013 | |
| 300 | |a 1 online resource (633 pages) : |b color illustrations, charts, photographs, graphs, tables | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 504 | |a Includes bibliographical references at the end of each chapters and index. | ||
| 588 | |a Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2014). | ||
| 590 | |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 0 | |a Electronic books. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society, |e sponsor. | |
| 776 | 0 | 8 | |i Print version: |a International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) |t ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA. |d Materials Park, Ohio : ASM International, c2013 |h xix, 613 pages |z 9781627080224 |
| 797 | 2 | |a ebrary. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10909850 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 175828 |d 175828 | ||