Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Guardado en:
| Autor Corporativo: | |
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| Otros Autores: | , |
| Formato: | Electrónico Procedimiento de la Conferencia eBook |
| Lenguaje: | inglés |
| Publicado: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
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| Colección: | Materials science forum ;
v. 725. |
| Materias: | |
| Acceso en línea: | An electronic book accessible through the World Wide Web; click to view |
| Etiquetas: |
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Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics i...
Publicado [2012]
An electronic book accessible through the World Wide Web; click to view
Electrónico
Procedimiento de la Conferencia
eBook