Cita APA (7th ed.)
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, Yamada-Kaneta, H., & Sakai, A. (2012). Defects-recognition, imaging and physics in semiconductors XIV: Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Trans Tech Publications.
Cita Chicago (17th ed.)
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, Hiroshi Yamada-Kaneta, i Akira Sakai. Defects-recognition, Imaging and Physics in Semiconductors XIV: Selected, Peer Reviewed Papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Durnten-Zurich ; Enfield, NH: Trans Tech Publications, 2012.
Cita MLA (9th ed.)
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan, et al. Defects-recognition, Imaging and Physics in Semiconductors XIV: Selected, Peer Reviewed Papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan. Trans Tech Publications, 2012.
Atenció: Aquestes cites poden no estar 100% correctes.