Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
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| Series: | ESD series
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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