Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clea...
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| Format: | Elektroniczne E-book |
| Język: | angielski |
| Wydane: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
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| Seria: | ESD series
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| Hasła przedmiotowe: | |
| Dostęp online: | An electronic book accessible through the World Wide Web; click to view |
| Etykiety: |
Nie ma etykietki, Dołącz pierwszą etykiete!
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