Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
Saved in:
主要作者: | |
---|---|
企業作者: | |
格式: | 電子 電子書 |
語言: | 英语 |
出版: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
|
叢編: | ESD series
|
主題: | |
在線閱讀: | An electronic book accessible through the World Wide Web; click to view |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|