Electrical overstress (EOS) devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...

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書目詳細資料
主要作者: Voldman, Steven H.
企業作者: ebrary, Inc
格式: 電子 電子書
語言:英语
出版: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
叢編:ESD series
主題:
在線閱讀:An electronic book accessible through the World Wide Web; click to view
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