Semiconductor strain metrology principles and applications /
Tallennettuna:
| Päätekijä: | |
|---|---|
| Yhteisötekijä: | |
| Aineistotyyppi: | Elektroninen E-kirja |
| Kieli: | englanti |
| Julkaistu: |
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL :
Bentham Science,
[2012]
|
| Aiheet: | |
| Linkit: | An electronic book accessible through the World Wide Web; click to view |
| Tagit: |
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|
Samankaltaisia teoksia: Semiconductor strain metrology
- Semiconductor strain metrology principles and applications /
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- Nanoscaled semiconductor-on-insulator materials, sensors and devices : selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24-28 October, 2010 Kyiv, Ukraine /
- An introduction to the physics and electrochemistry of semiconductors : fundamentals and applications /
- An introduction to the physics and electrochemistry of semiconductors : fundamentals and applications /
- Materials for high-temperature semiconductor devices