Wong, T. K. S. (2012). Semiconductor strain metrology: Principles and applications. Bentham Science.
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Citação norma Chicago
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL: Bentham Science, 2012.
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Citação norma MLA
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. Bentham Science, 2012.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.