Cita APA (7th ed.)
Wong, T. K. S. (2012). Semiconductor strain metrology: Principles and applications. Bentham Science.
Cita Chicago (17th ed.)
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL: Bentham Science, 2012.
Cita MLA (9th ed.)
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. Bentham Science, 2012.
Atenció: Aquestes cites poden no estar 100% correctes.