APA ציטוט
Wong, T. K. S. (2012). Semiconductor strain metrology: Principles and applications. Bentham Science.
Chicago Style (17th ed.) Citation
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL: Bentham Science, 2012.
ציטוט MLA
Wong, Terence K. S. Semiconductor Strain Metrology: Principles and Applications. Bentham Science, 2012.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.