Microelectronics failure analysis desk reference /
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Edition: | 6th ed. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
No Tags, Be the first to tag this record!
|
Similar Items: Microelectronics failure analysis
- Microelectronic failure analysis desk reference.
- Microelectronic failure analysis desk reference : 2001 supplement /
- ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
- ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
- The digital consumer technology handbook a comprehensive guide to devices, standards, future directions, and programmable logic solutions /
- Electronic materials science