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Microelectronics failure analysis desk reference /

Tallennettuna:
Yhteisötekijä: ebrary, Inc
Muut tekijät: Ross, Richard J.
Aineistotyyppi: Elektroninen E-kirja
Kieli:englanti
Julkaistu: Materials Park, Ohio : ASM International, c2011.
Painos:6th ed.
Aiheet:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Electronic books.
Linkit:An electronic book accessible through the World Wide Web; click to view
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Sisällysluettelo:
  • section 1. Introduction
  • section 2. Failure analysis process overviews
  • section 3. Failure analysis topics
  • section 4. Fault verification and classification
  • section 5. Localization techniques
  • section 6. Deprocessing and sample preparation
  • section 7. Inspection
  • section 8. Materials analysis
  • section 9. Focused ion beam applications
  • section 10. Management and reference information.

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