Microelectronics failure analysis desk reference /
Kaydedildi:
| Müşterek Yazar: | |
|---|---|
| Diğer Yazarlar: | |
| Materyal Türü: | Elektronik Ekitap |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
Materials Park, Ohio :
ASM International,
c2011.
|
| Edisyon: | 6th ed. |
| Konular: | |
| Online Erişim: | An electronic book accessible through the World Wide Web; click to view |
| Etiketler: |
Etiket eklenmemiş, İlk siz ekleyin!
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İçindekiler:
- section 1. Introduction
- section 2. Failure analysis process overviews
- section 3. Failure analysis topics
- section 4. Fault verification and classification
- section 5. Localization techniques
- section 6. Deprocessing and sample preparation
- section 7. Inspection
- section 8. Materials analysis
- section 9. Focused ion beam applications
- section 10. Management and reference information.