ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
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| Corporate Authors: | , , , |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, Ohio :
ASM International,
2010.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 020 | |z 9781615030415 | ||
| 020 | |z 0615030416 | ||
| 020 | |z 9781615037278 (e-book) | ||
| 035 | |a (CaPaEBR)ebr10439476 | ||
| 035 | |a (OCoLC)704518529 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .I87 2010eb |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (36th : |d 2010 : |c Dallas, Tex.) | |
| 245 | 1 | 0 | |a ISTFA 2010 |h [electronic resource] : |b conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International. |
| 260 | |a Materials Park, Ohio : |b ASM International, |c 2010. | ||
| 300 | |a xix, 464 p. : |b ill. (some col.) | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2011. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10439476 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
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| 999 | |c 118987 |d 118987 | ||