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ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

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Furkejuvvon:
Searvvušdahkkit: International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, Ohio : ASM International, 2010.
Fáttát:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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Olgguldas hápmi:xix, 464 p. : ill. (some col.)
Bibliografiija:Includes bibliographical references and index.

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