International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2010). ISTFA 2010: Conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International.
Kopioitu leikepöydälle
Kopiointi leikepöydälle epäonnistui
Chicago-viite (17. p.)
International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, ja Inc ebrary. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. Materials Park, Ohio: ASM International, 2010.
Kopioitu leikepöydälle
Kopiointi leikepöydälle epäonnistui
MLA-viite (9. p.)
International Symposium for Testing and Failure Analysis Dallas, Tex., et al. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International, 2010.
Kopioitu leikepöydälle
Kopiointi leikepöydälle epäonnistui
Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.