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Tohutoro APA (7th ed.)
International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, & ebrary, Inc. (2010). ISTFA 2010: Conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International.
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Tohutoru Kātū Chicago (17th ed.)
International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, Electronic Device Failure Analysis Society, me Inc ebrary. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. Materials Park, Ohio: ASM International, 2010.
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Tohutoro MLA (9th ed.)
International Symposium for Testing and Failure Analysis Dallas, Tex., et al. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International, 2010.
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