Electrical overstress (EOS) devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
Glavni avtor: Voldman, Steven H.
Korporativna značnica: ebrary, Inc
Format: Elektronski eKnjiga
Jezik:angleščina
Izdano: Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Serija:ESD series
Teme:
Online dostop:An electronic book accessible through the World Wide Web; click to view
Oznake: Označite
Brez oznak, prvi označite!