Electrical overstress (EOS) devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...

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主要作者:	Voldman, Steven H.
企业作者:	ebrary, Inc
格式:	电子 电子书
语言:	英语
出版:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
丛编:	ESD series
主题:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
在线阅读:	An electronic book accessible through the World Wide Web; click to view
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