Reliability of MEMS testing of materials and devices /

Saved in:
Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Tabata, Osamu, Tsuchiya, Toshiyuki
Format: Electronic eBook
Language:English
Published: Weinheim : Wiley-VCH, 2013.
Series:Advanced micro & nanosystems.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!
Search Result 1