Beam effects, surface topography, and depth profiling in surface analysis

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Kaituhi rangatōpū: ebrary, Inc
Ētahi atu kaituhi: Czanderna, Alvin Warren, 1930-, Madey, Theodore E., Powell, C. J. (Cedric John)
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: New York : Plenum Press, c1998.
Rangatū:Methods of surface characterization ; v. 5.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
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