Beam effects, surface topography, and depth profiling in surface analysis

Sábháilte in:
Sonraí bibleagrafaíochta
Údar corparáideach: ebrary, Inc
Rannpháirtithe: Czanderna, Alvin Warren, 1930-, Madey, Theodore E., Powell, C. J. (Cedric John)
Formáid: Leictreonach Ríomhleabhar
Teanga:Béarla
Foilsithe / Cruthaithe: New York : Plenum Press, c1998.
Sraith:Methods of surface characterization ; v. 5.
Ábhair:
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