Beam effects, surface topography, and depth profiling in surface analysis
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Corporate Author: | |
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Other Authors: | , , |
Format: | Electronic eBook |
Language: | English |
Published: |
New York :
Plenum Press,
c1998.
|
Series: | Methods of surface characterization ;
v. 5. |
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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LEADER | 00000nam a2200000 a 4500 | ||
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001 | 0000069749 | ||
005 | 20171002053435.0 | ||
006 | m u | ||
007 | cr cn||||||||| | ||
008 | 980811s1998 nyua sb 001 0 eng | ||
010 | |z 98041250 | ||
020 | |z 0306458969 | ||
035 | |a (CaPaEBR)ebr10046976 | ||
035 | |a (OCoLC)229449306 | ||
040 | |a CaPaEBR |c CaPaEBR | ||
050 | 1 | 4 | |a TA418.7 |b .B43 1998eb |
082 | 0 | 4 | |a 620/.44 |2 21 |
245 | 0 | 0 | |a Beam effects, surface topography, and depth profiling in surface analysis |h [electronic resource] / |c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. |
260 | |a New York : |b Plenum Press, |c c1998. | ||
300 | |a xix, 430 p. : |b ill. | ||
490 | 1 | |a Methods of surface characterization ; |v v. 5 | |
504 | |a Includes bibliographical references and index. | ||
533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
650 | 0 | |a Surfaces (Technology) |x Analysis. | |
650 | 0 | |a Materials |x Effect of radiation on. | |
655 | 7 | |a Electronic books. |2 local | |
700 | 1 | |a Czanderna, Alvin Warren, |d 1930- | |
700 | 1 | |a Madey, Theodore E. | |
700 | 1 | |a Powell, C. J. |q (Cedric John) | |
710 | 2 | |a ebrary, Inc. | |
830 | 0 | |a Methods of surface characterization ; |v v. 5. | |
856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10046976 |z An electronic book accessible through the World Wide Web; click to view |
908 | |a 170314 | ||
942 | 0 | 0 | |c EB |
999 | |c 58907 |d 58907 |