System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday /

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Hayakawa, Yu, Irony, Telba, Xie, M. (Min), Barlow, Richard E.
Format: Electronic eBook
Language:English
Published: River Edge, NJ : World Scientific, c2001.
Series:Series on quality, reliability & engineering statistics ; v. 5.
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Online Access:An electronic book accessible through the World Wide Web; click to view
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