Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Bibliographic Details
Other Authors:	Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
Format:	Electronic eBook
Language:	English
Published:	New Jersey : World Scientific, [2014]
Subjects:	Reliability (Engineering) Stochastic systems. Electronic books.
Online Access:	An electronic book accessible through the World Wide Web; click to view
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